T. Sridhar
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1985
2
T. Sridhar: A New Parallel Test Approach for Large Memories.
ITC 1985
: 462-470
1
Stephen L. Lusky
, T. Sridhar: Detectable CMOS Faults in Switch-Level Simulation.
ITC 1985
: 875-883
Coauthor
Index
1
Stephen L. Lusky
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)