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T. Sridhar

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1985
2 T. Sridhar: A New Parallel Test Approach for Large Memories. ITC 1985: 462-470
1 Stephen L. Lusky, T. Sridhar: Detectable CMOS Faults in Switch-Level Simulation. ITC 1985: 875-883

Coauthor Index

1Stephen L. Lusky [1]

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