2008 |
6 | EE | Chao Sima,
Edward R. Dougherty:
The peaking phenomenon in the presence of feature-selection.
Pattern Recognition Letters 29(11): 1667-1674 (2008) |
2007 |
5 | EE | Marcel Brun,
Chao Sima,
Jianping Hua,
James Lowey,
Brent Carroll,
Edward Suh,
Edward R. Dougherty:
Model-based evaluation of clustering validation measures.
Pattern Recognition 40(3): 807-824 (2007) |
2006 |
4 | EE | Chao Sima,
Edward R. Dougherty:
What should be expected from feature selection in small-sample settings.
Bioinformatics 22(19): 2430-2436 (2006) |
3 | EE | Chao Sima,
Edward R. Dougherty:
Optimal convex error estimators for classification.
Pattern Recognition 39(9): 1763-1780 (2006) |
2005 |
2 | EE | Chao Sima,
Ulisses Braga-Neto,
Edward R. Dougherty:
Superior feature-set ranking for small samples using bolstered error estimation.
Bioinformatics 21(7): 1046-1054 (2005) |
1 | EE | Chao Sima,
Sanju Attoor,
Ulisses Braga-Neto,
James Lowey,
Edward Suh,
Edward R. Dougherty:
Impact of error estimation on feature selection.
Pattern Recognition 38(12): 2472-2482 (2005) |