D. B. Shu
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1988
1
EE
D. B. Shu,
C. C. Li
,
J. F. Mancuso
,
Y. N. Sun
: A Line Extraction Method for Automated SEM Inspection of VLSI Resist.
IEEE Trans. Pattern Anal. Mach. Intell. 10
(1): 117-120 (1988)
Coauthor
Index
1
C. C. Li
[
1
]
2
J. F. Mancuso
[
1
]
3
Y. N. Sun
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
