S. G. Sharshunov
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2006
1
V. V. Belkin
, S. G. Sharshunov: ISA Based Functional Test Generation with Application to Self-Test of RISC Processors.
DDECS 2006
: 75-76
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1
V. V. Belkin
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
