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N. G. Shankar

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2006
2EEN. G. Shankar, Z. W. Zhong: A rule-based computing approach for the segmentation of semiconductor defects. Microelectronics Journal 37(6): 500-509 (2006)
2005
1EEN. G. Shankar, Z. W. Zhong: A new rule-based clustering technique for defect analysis. Microelectronics Journal 36(8): 718-724 (2005)

Coauthor Index

1Z. W. Zhong [1] [2]

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