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| 2006 | ||
|---|---|---|
| 2 | EE | N. G. Shankar, Z. W. Zhong: A rule-based computing approach for the segmentation of semiconductor defects. Microelectronics Journal 37(6): 500-509 (2006) |
| 2005 | ||
| 1 | EE | N. G. Shankar, Z. W. Zhong: A new rule-based clustering technique for defect analysis. Microelectronics Journal 36(8): 718-724 (2005) |
| 1 | Z. W. Zhong | [1] [2] |