2006 | ||
---|---|---|
2 | EE | N. G. Shankar, Z. W. Zhong: A rule-based computing approach for the segmentation of semiconductor defects. Microelectronics Journal 37(6): 500-509 (2006) |
2005 | ||
1 | EE | N. G. Shankar, Z. W. Zhong: A new rule-based clustering technique for defect analysis. Microelectronics Journal 36(8): 718-724 (2005) |
1 | Z. W. Zhong | [1] [2] |