| |
| 2006 | ||
|---|---|---|
| 1 | EE | Shinichi Hoshi, Toshiharu Marui, Masanori Itoh, Yoshiaki Sano, Shouhei Seki: Influence of NH3-Plasma Pretreatment before Si3N4 Passivation Film Deposition on Current Collapse in AlGaN/GaN-HEMTs. IEICE Transactions 89-C(7): 1052-1056 (2006) |
| 1 | Shinichi Hoshi | [1] |
| 2 | Masanori Itoh | [1] |
| 3 | Toshiharu Marui | [1] |
| 4 | Yoshiaki Sano | [1] |