| |
| 2006 | ||
|---|---|---|
| 1 | EE | Michael Ott, Jason Abt, Udit Sharma, Edward Keyes, Trevor J. Hall, Henry Schriemer: Quantitative Capacitance Measurements of MOS Structures using a Scanning Probe Microscope. CCECE 2006: 842-845 |
| 1 | Jason Abt | [1] |
| 2 | Trevor J. Hall | [1] |
| 3 | Edward Keyes | [1] |
| 4 | Michael Ott | [1] |
| 5 | Udit Sharma | [1] |