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Yoshimichi Satoh

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1996
1 Nobuyasu Kanekawa, Makoto Nohmi, Yoshimichi Satoh, Hiroshi Satoh: Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy. FTCS 1996: 426-430

Coauthor Index

1Nobuyasu Kanekawa [1]
2Makoto Nohmi [1]
3Hiroshi Satoh [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)