Yoshimichi Satoh
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1996
1
Nobuyasu Kanekawa
,
Makoto Nohmi
, Yoshimichi Satoh,
Hiroshi Satoh
: Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy.
FTCS 1996
: 426-430
Coauthor
Index
1
Nobuyasu Kanekawa
[
1
]
2
Makoto Nohmi
[
1
]
3
Hiroshi Satoh
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
