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| 1995 | ||
|---|---|---|
| 1 | EE | V. Radhakrishnan, N. Achutan, S. Verghese, R. Santoshkumar: A new approach to the measurement of surface roughness using the pulse-jet capacitance method. Electronic Technology Directions 1995: 294-300 |
| 1 | N. Achutan | [1] |
| 2 | V. Radhakrishnan | [1] |
| 3 | S. Verghese | [1] |