Arthur S. Sanderson
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1988
1
EE
Arthur S. Sanderson,
Lee E. Weiss
,
Shree K. Nayar
: Structured Highlight Inspection of Specular Surfaces.
IEEE Trans. Pattern Anal. Mach. Intell. 10
(1): 44-55 (1988)
Coauthor
Index
1
Shree K. Nayar
[
1
]
2
Lee E. Weiss
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
