R. A. Said
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1999
1
EE
R. A. Said: Internal testing of integrated circuits by noncontact sampling electrostatic force microscopy using pulse width modulation technique.
ISCAS (1) 1999
: 124-128
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)