| |
| 2007 | ||
|---|---|---|
| 1 | EE | George R. Roelke, Rusty O. Baldwin, Barry E. Mullins, Yong C. Kim: A Cache Architecture for Extremely Unreliable Nanotechnologies. IEEE Transactions on Reliability 56(2): 182-197 (2007) |
| 1 | Rusty O. Baldwin | [1] |
| 2 | Yong C. Kim | [1] |
| 3 | Barry E. Mullins | [1] |