E. Riess
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2000
1
E. Riess: Automatic monitoring of electrical parameters in the semiconductor industry based on ROC.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 30
(6): 853-857 (2000)
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)