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Venkata S. Rangavajjhala

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1993
1EEVenkata S. Rangavajjhala, Bharat L. Bhuva, Sherra E. Kerns: Statistical degradation analysis of digital CMOS IC's. IEEE Trans. on CAD of Integrated Circuits and Systems 12(6): 837-844 (1993)

Coauthor Index

1Bharat L. Bhuva [1]
2Sherra E. Kerns [1]

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