Venkata S. Rangavajjhala
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1993
1
EE
Venkata S. Rangavajjhala,
Bharat L. Bhuva
,
Sherra E. Kerns
: Statistical degradation analysis of digital CMOS IC's.
IEEE Trans. on CAD of Integrated Circuits and Systems 12
(6): 837-844 (1993)
Coauthor
Index
1
Bharat L. Bhuva
[
1
]
2
Sherra E. Kerns
[
1
]
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Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)