Akhileswaran Ramachandran
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1997
1
Jin Chen
, Akhileswaran Ramachandran: A Novel Test Set Design for Parametric Testing of Analog and Mixed-Signal Circuits.
ICCD 1997
: 474-480
Coauthor
Index
1
Jin Chen
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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