Arun Radhakrishnan
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2006
1
EE
Mehrdad Nourani
, Arun Radhakrishnan: Testing On-Die Process Variation in Nanometer VLSI.
IEEE Design & Test of Computers 23
(6): 438-451 (2006)
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1
Mehrdad Nourani
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Sun May 17 03:24:02 2009 by
Michael Ley
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ley@uni-trier.de
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