Keld Raaschou
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2008
1
EE
Keld Raaschou,
Austen W. Rainer
: Exposure model for prediction of number of customer reported defects.
ESEM 2008
: 306-308
Coauthor
Index
1
Austen W. Rainer
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
