J. Pulou
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1994
1
G. Masseboeuf
, J. Pulou,
J. L. Rainard
: Hierarchical Test Analysis of VLSI Circuits for Random BIST.
EDCC 1994
: 271-288
Coauthor
Index
1
G. Masseboeuf
[
1
]
2
J. L. Rainard
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
