2009 | ||
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2 | EE | Nicolas Bissantz, Hajo Holzmann, M. Pawlak: Testing for Image Symmetries - With Application to Confocal Microscopy. IEEE Transactions on Information Theory 55(4): 1841-1855 (2009) |
1998 | ||
1 | M. Pawlak, D. Siu: Pattern Classification with Noisy Features. SSPR/SPR 1998: 845-852 |
1 | Nicolas Bissantz | [2] |
2 | Hajo Holzmann | [2] |
3 | D. Siu | [1] |