John A. Patten

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2005

1 EE Lei Dong, John A. Patten, Jimmie A. Miller: In-situ infrared detection and heating of metallic phase of silicon during scratching test. IJMTM 7(5/6): 530-539 (2005)

2005
1	EE	Lei Dong, John A. Patten, Jimmie A. Miller: In-situ infrared detection and heating of metallic phase of silicon during scratching test. IJMTM 7(5/6): 530-539 (2005)

Coauthor Index

1 Lei Dong [1]

2 Jimmie A. Miller [1]