Chang Gyun Park

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2004

1 EE Jin Soo Noh, Chang Gyun Park, Kang Hyeon Rhee: Path Sensitization and Sub-circuit Partition of CUT Using t-Distribution for Pseudo-exhaustive Testing. AsiaSim 2004: 205-213

2004
1	EE	Jin Soo Noh, Chang Gyun Park, Kang Hyeon Rhee: Path Sensitization and Sub-circuit Partition of CUT Using t-Distribution for Pseudo-exhaustive Testing. AsiaSim 2004: 205-213

Coauthor Index

1 Jin Soo Noh [1]

2 Kang Hyeon Rhee [1]