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Manuel Pancorbo

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1994
3EEMiguel Aguilar, Manuel Pancorbo: Noise characterization in scanning tunneling microscopy (STM). Pattern Recognition Letters 15(10): 985-992 (1994)
1993
2 Eloy Anguiano, Manuel Pancorbo, Miguel Aguilar: Pitfalls in the Fractal Characterization of Real Microscopic Surfaces by Frequency. Fractals in the Natural and Applied Sciences 1993: 37-46
1990
1EEManuel Pancorbo, Eloy Anguiano, A. Diaspro, Miguel Aguilar: A Wiener filter with circular-aperture-like point spread function to restore scanning tunneling microscopy (STM) images. Pattern Recognition Letters 11(8): 553-556 (1990)

Coauthor Index

1Miguel Aguilar [1] [2] [3]
2Eloy Anguiano [1] [2]
3A. Diaspro [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)