John C. Pagano
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1985
1
Frank H. Hielscher
, John C. Pagano: Backdrive Stress-Testing of CMOS Gate Array Circuits.
ITC 1985
: 523-533
Coauthor
Index
1
Frank H. Hielscher
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
