| 2008 |
|---|
| 9 | EE | Jarmo Ilonen,
Joni-Kristian Kamarainen,
Pekka Paalanen,
Miroslav Hamouz,
Josef Kittler,
Heikki Kälviäinen:
Image Feature Localization by Multiple Hypothesis Testing of Gabor Features.
IEEE Transactions on Image Processing 17(3): 311-325 (2008) |
| 2007 |
|---|
| 8 | EE | Joni-Kristian Kamarainen,
Miroslav Hamouz,
Josef Kittler,
Pekka Paalanen,
Jarmo Ilonen,
Alexander Drobchenko:
Object Localisation Using Generative Probability Model for Spatial Constellation and Local Image Features.
ICCV 2007: 1-8 |
| 2006 |
|---|
| 7 | EE | Jarkko Vartiainen,
S. Lyden,
Albert Sadovnikov,
Joni-Kristian Kamarainen,
Lasse Lensu,
Pekka Paalanen,
Heikki Kälviäinen:
Automating Visual Inspection of Print Quality.
ICIAR (2) 2006: 877-885 |
| 6 | EE | Jarmo Ilonen,
Pekka Paalanen,
Joni-Kristian Kamarainen,
Heikki Kälviäinen:
Gaussian mixture pdf in one-class classification: computing and utilizing confidence values.
ICPR (2) 2006: 577-580 |
| 5 | EE | Pekka Paalanen,
Joni-Kristian Kamarainen,
Jarmo Ilonen,
Heikki Kälviäinen:
Feature representation and discrimination based on Gaussian mixture model probability densities - Practices and algorithms.
Pattern Recognition 39(7): 1346-1358 (2006) |
| 2005 |
|---|
| 4 | EE | Joni-Kristian Kamarainen,
Jarmo Ilonen,
Pekka Paalanen,
Miroslav Hamouz,
Heikki Kälviäinen,
Josef Kittler:
Object Evidence Extraction Using Simple Gabor Features and Statistical Ranking.
SCIA 2005: 119-129 |
| 3 | EE | Jarmo Ilonen,
Pekka Paalanen,
Joni-Kristian Kamarainen,
T. Lindh,
J. Ahola,
Heikki Kälviäinen,
J. Partanen:
Toward Automatic Motor Condition Diagnosis.
SCIA 2005: 970-977 |
| 2 | EE | Miroslav Hamouz,
Josef Kittler,
Joni-Kristian Kamarainen,
Pekka Paalanen,
Heikki Kälviäinen,
Jiri Matas:
Feature-Based Affine-Invariant Localization of Faces.
IEEE Trans. Pattern Anal. Mach. Intell. 27(9): 1490-1495 (2005) |
| 2004 |
|---|
| 1 | EE | Miroslav Hamouz,
Josef Kittler,
Joni-Kristian Kamarainen,
Pekka Paalanen,
Heikki Kälviäinen:
Affine-Invariant Face Detection and Localization Using GMM-based Feature Detector and Enhanced Appearance Model.
FGR 2004: 67-72 |
