Yirong OuYang

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2005

1 EE Yirong OuYang, Jiarong Tong: A New Universal Test Pattern Auto-generating Approach for FPGA Logic Resources (abstract only). FPGA 2005: 263

2005
1	EE	Yirong OuYang, Jiarong Tong: A New Universal Test Pattern Auto-generating Approach for FPGA Logic Resources (abstract only). FPGA 2005: 263

Coauthor Index

1 Jiarong Tong [1]