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2006 | ||
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1 | EE | Carlos Oscar Sánchez Sorzano, E. Ortiz, M. López, J. Rodrigo: Improved Bayesian image denoising based on wavelets with applications to electron microscopy. Pattern Recognition 39(6): 1205-1213 (2006) |
1 | M. López | [1] |
2 | J. Rodrigo | [1] |
3 | Carlos Oscar Sánchez Sorzano | [1] |