2005 | ||
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1 | EE | Radj A. Baldewsing, Johannes A. Schaar, Frits Mastik, Cees. W. J. Oomens, Anton F. W. van der Steen: Assessment of vulnerable plaque composition by matching the deformation of a parametric plaque model to measured plaque deformation. IEEE Trans. Med. Imaging 24(4): 514-528 (2005) |
1 | Radj A. Baldewsing | [1] |
2 | Frits Mastik | [1] |
3 | Johannes A. Schaar | [1] |
4 | Anton F. W. van der Steen | [1] |