| |
| 1988 | ||
|---|---|---|
| 1 | EE | Haruo Yoda, Yozo Ohuchi, Yuzo Taniguchi, Masakazu Ejiri: An Automatic Wafer Inspection System Using Pipelined Image Processing Techniques. IEEE Trans. Pattern Anal. Mach. Intell. 10(1): 4-16 (1988) |
| 1 | Masakazu Ejiri | [1] |
| 2 | Yuzo Taniguchi | [1] |
| 3 | Haruo Yoda | [1] |