1988 | ||
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1 | EE | Haruo Yoda, Yozo Ohuchi, Yuzo Taniguchi, Masakazu Ejiri: An Automatic Wafer Inspection System Using Pipelined Image Processing Techniques. IEEE Trans. Pattern Anal. Mach. Intell. 10(1): 4-16 (1988) |
1 | Masakazu Ejiri | [1] |
2 | Yuzo Taniguchi | [1] |
3 | Haruo Yoda | [1] |