| |
| 2001 | ||
|---|---|---|
| 2 | EE | Satoshi Nishino, Kenji Ohshima: Fault detection for IC board using histogram of thermography. Systems and Computers in Japan 32(11): 38-48 (2001) |
| 1998 | ||
| 1 | EE | Satoshi Nishino, Kenji Ohshima: A study on fault detection for IC boards using thermography. Systems and Computers in Japan 29(5): 49-61 (1998) |
| 1 | Satoshi Nishino | [1] [2] |