| 2008 |
|---|
| 4 | EE | Jong-Hwan Oh,
Byoung-Ju Yun,
Se-Yun Kim,
Kil-Houm Park:
A Development of the TFT-LCD Image Defect Inspection Method Based on Human Visual System.
IEICE Transactions 91-A(6): 1400-1407 (2008) |
| 2007 |
|---|
| 3 | EE | Jong-Hwan Oh,
Byoung-Ju Yun,
Kil-Houm Park:
The Defect Detection Using Human Visual System and Wavelet Transform in TFT-LCD Image.
FBIT 2007: 498-503 |
| 2 | EE | Woo-Seob Kim,
Jong-Hwan Oh,
Chan-Ho Han,
Kil-Houm Park:
Image Enhancement for Automated TFT-LCD Inspection System Using Estimation of Intensity Flow.
IEICE Transactions 90-C(11): 2126-2130 (2007) |
| 1 | EE | Jong-Hwan Oh,
Woo-Seob Kim,
Chan-Ho Han,
Kil-Houm Park:
Defect Detection of TFT-LCD Image Using Adapted Contrast Sensitivity Function and Wavelet Transform.
IEICE Transactions 90-C(11): 2131-2135 (2007) |
