J. Nishiura
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1985
1
M. Shimizu
,
N. Okino
, J. Nishiura,
H. Maruyama
: Memory Embedded VLSI Gate Array Testing.
ITC 1985
: 438-444
Coauthor
Index
1
H. Maruyama
[
1
]
2
N. Okino
[
1
]
3
M. Shimizu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
