| |
| 2008 | ||
|---|---|---|
| 1 | EE | Yusuke Ohtomo, Hiroshi Koizumi, Kazuyoshi Nishimura, Masafumi Nogawa: A PVT Tolerant STM-16 Clock-and-Data Recovery LSI Using an On-Chip Loop-Gain Variation Compensation Architecture in 0.20-µm CMOS/SOI. IEICE Transactions 91-C(4): 655-661 (2008) |
| 1 | Hiroshi Koizumi | [1] |
| 2 | Masafumi Nogawa | [1] |
| 3 | Yusuke Ohtomo | [1] |