Tien Duc Nguyen
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2006
1
EE
Tien Duc Nguyen,
Xuan Nam Tran
,
Tadashi Fujino
: Layer Error Characteristics of Lattice-Reduction Aided V-BLAST Detectors.
IEICE Transactions 89-A
(10): 2535-2542 (2006)
Coauthor
Index
1
Tadashi Fujino
[
1
]
2
Xuan Nam Tran
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
