2008 |
4 | EE | Henry Y. T. Ngan,
Grantham K. H. Pang,
Nelson Hon Ching Yung:
Motif-based defect detection for patterned fabric.
Pattern Recognition 41(6): 1878-1894 (2008) |
2007 |
3 | EE | Henry Y. T. Ngan,
Grantham K. H. Pang,
Nelson Hon Ching Yung:
Patterned Fabric Defect Detection using a Motif-Based Approach.
ICIP (2) 2007: 33-36 |
2005 |
2 | EE | Henry Y. T. Ngan,
Grantham K. H. Pang,
S. P. Yung,
Michael Kwok-Po Ng:
Wavelet based methods on patterned fabric defect detection.
Pattern Recognition 38(4): 559-576 (2005) |
2003 |
1 | EE | Henry Y. T. Ngan,
Grantham K. H. Pang,
S. P. Yung,
Michael K. Ng:
Defect Detection on Patterned Jacquard Fabric.
AIPR 2003: 163-168 |