| |
| 2008 | ||
|---|---|---|
| 3 | EE | W. B. Nelson: Residuals and Their Analyses for Accelerated Life Tests With Step and Varying Stress. IEEE Transactions on Reliability 57(2): 360-368 (2008) |
| 2005 | ||
| 2 | EE | W. B. Nelson: A bibliography of accelerated test plans. IEEE Transactions on Reliability 54(2): 194-197 (2005) |
| 1 | EE | W. B. Nelson: A bibliography of accelerated test plans part II - references. IEEE Transactions on Reliability 54(3): 370-373 (2005) |