P. F. Nealey
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2007
1
EE
P. Ravindran
,
Nicola J. Ferrier
,
S. M. Park
, P. F. Nealey: Image Based Metrology for Quantitative Analysis of Local Structural Similarity of Nanostructures.
ICIP (4) 2007
: 329-332
Coauthor
Index
1
Nicola J. Ferrier
[
1
]
2
S. M. Park
[
1
]
3
P. Ravindran
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
