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M. Rajaram Narayanan

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2007
2 M. Rajaram Narayanan, S. Gowri, M. Murali Krishna: On Line Surface Roughness Measurement Using Image Processing and Machine Vision. World Congress on Engineering 2007: 645-647
2005
1EEM. Rajaram Narayanan, S. Gowri, S. Ravi: An Evolvable Hardware Chip for Image Enhancement in Surface Roughness Estimation. ICNC (3) 2005: 361-365

Coauthor Index

1S. Gowri [1] [2]
2M. Murali Krishna [2]
3S. Ravi [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)