| |
| 2002 | ||
|---|---|---|
| 1 | EE | Akito Monden, Daikai Nakae, Toshihiro Kamiya, Shin-ichi Sato, Ken-ichi Matsumoto: Software Quality Analysis by Code Clones in Industrial Legacy Software. IEEE METRICS 2002: 87- |
| 1 | Toshihiro Kamiya | [1] |
| 2 | Ken-ichi Matsumoto | [1] |
| 3 | Akito Monden | [1] |
| 4 | Shin-ichi Sato | [1] |