| |
| 2006 | ||
|---|---|---|
| 4 | EE | Swapna S. Gokhale, Robert E. Mullen: Queuing Models for Field Defect Resolution Process. ISSRE 2006: 353-362 |
| 2005 | ||
| 3 | EE | Swapna S. Gokhale, Robert E. Mullen: Dynamic Code Coverage Metrics: A Lognormal Perspective. IEEE METRICS 2005: 33 |
| 2 | EE | Robert E. Mullen, Swapna S. Gokhale: Software Defect Rediscoveries: A Discrete Lognormal Model. ISSRE 2005: 203-212 |
| 2004 | ||
| 1 | EE | Swapna S. Gokhale, Robert E. Mullen: From Test Count to Code Coverage using the Lognormal Failure Rate. ISSRE 2004: 295-305 |
| 1 | Swapna S. Gokhale | [1] [2] [3] [4] |