Abir Mukherjee
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2006
1
EE
Ayhan A. Mutlu
,
Charles Kwong
, Abir Mukherjee,
Mahmud Rahman
: Statistical circuit performance variability minimization under manufacturing variations.
ISCAS 2006
Coauthor
Index
1
Charles Kwong
[
1
]
2
Ayhan A. Mutlu
[
1
]
3
Mahmud Rahman
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
