Shinji Miyano
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1999
1
EE
Shinji Miyano,
Katsuhiko Sato
,
Kenji Numata
: Universal Test Interface for Embedded-DRAM Testing.
IEEE Design & Test of Computers 16
(1): 53-58 (1999)
Coauthor
Index
1
Kenji Numata
[
1
]
2
Katsuhiko Sato
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
