Tohru Matsuodani

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2004

1 EE Tohru Matsuodani, Kazuhiko Tsuda: Evaluation of debug-testing efficiency by duplication of the detected fault and delay time of repair. Inf. Sci. 166(1-4): 83-103 (2004)

2004
1	EE	Tohru Matsuodani, Kazuhiko Tsuda: Evaluation of debug-testing efficiency by duplication of the detected fault and delay time of repair. Inf. Sci. 166(1-4): 83-103 (2004)

Coauthor Index

1 Kazuhiko Tsuda [1]