Ovidio V. Maiuri

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1998

1 EE Ovidio V. Maiuri, Will R. Moore: Implications of Voltage and Dimension Scaling on CMOS Testing: The Multidimensional Testing Paradigm. VTS 1998: 22-27

1998
1	EE	Ovidio V. Maiuri, Will R. Moore: Implications of Voltage and Dimension Scaling on CMOS Testing: The Multidimensional Testing Paradigm. VTS 1998: 22-27

Coauthor Index

1 Will R. Moore [1]