Fabrice Mairesse
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2008
1
EE
Fabrice Mairesse,
Tadeusz Sliwa
,
Stéphane Binczak
,
Yvon Voisin
: Subpixel determination of imperfect circles characteristics.
Pattern Recognition 41
(1): 250-271 (2008)
Coauthor
Index
1
Stéphane Binczak
[
1
]
2
Tadeusz Sliwa
[
1
]
3
Yvon Voisin
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
