José Maia
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2002
1
EE
K. J. Stanley
,
Timothy D. Stanley
, José Maia: Wafer fabrication: realizing 300mm fab productivity improvements through integrated metrology.
Winter Simulation Conference 2002
: 1369-1376
Coauthor
Index
1
K. J. Stanley
[
1
]
2
Timothy D. Stanley
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
