Y.-W. Mai
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2006
1
EE
E. H. Wong
, Y.-W. Mai: New insights into board level drop impact.
Microelectronics Reliability 46
(5-6): 930-938 (2006)
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E. H. Wong
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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