| |
| 1992 | ||
|---|---|---|
| 1 | Paul M. Fahey, Siegfried R. Mader, Scott R. Stiffler, Rick L. Mohler, J. Daniel Mis, James A. Slinkman: Stress-induced dislocations in silicon integrated circuits. IBM Journal of Research and Development 36(2): 158-182 (1992) | |
| 1 | Paul M. Fahey | [1] |
| 2 | J. Daniel Mis | [1] |
| 3 | Rick L. Mohler | [1] |
| 4 | James A. Slinkman | [1] |
| 5 | Scott R. Stiffler | [1] |