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Mohammed R. Madani

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1998
2EEM. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi: Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. IEEE Trans. on CAD of Integrated Circuits and Systems 17(4): 366-371 (1998)
1994
1 M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi: Parameterized Modeling of Open-Circuit Critical Volume for Three-Dimensional Defects in VLSI Processing. VLSI Design 1994: 333-338

Coauthor Index

1Magdy A. Bayoumi (Magdy Bayoumi) [1] [2]
2M. K. Kidambi [1] [2]
3Akhilesh Tyagi [1] [2]

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