| |
| 1998 | ||
|---|---|---|
| 2 | EE | M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi: Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. IEEE Trans. on CAD of Integrated Circuits and Systems 17(4): 366-371 (1998) |
| 1994 | ||
| 1 | M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi: Parameterized Modeling of Open-Circuit Critical Volume for Three-Dimensional Defects in VLSI Processing. VLSI Design 1994: 333-338 | |
| 1 | Magdy A. Bayoumi (Magdy Bayoumi) | [1] [2] |
| 2 | M. K. Kidambi | [1] [2] |
| 3 | Akhilesh Tyagi | [1] [2] |