Brian Lukoff
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2008
1
EE
Matthew K. Feusner
, Brian Lukoff: Testing for statistically significant differences between groups of scan patterns.
ETRA 2008
: 43-46
Coauthor
Index
1
Matthew K. Feusner
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)