M. J. LuValle
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2007
1
EE
M. J. LuValle: Identifying Mechanisms That Highly Accelerated Tests Miss.
IEEE Transactions on Reliability 56
(2): 349-359 (2007)
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)